Issue link: https://resources.mouser.com/i/1490195
An Engineer's Guide to High Reliability Components 14 Parasitics and Reliability Simultaneously achieving high power and high reliability in analog power electronics is difficult for several reasons. One of the major reasons is the increased impact of device parasitics— unwanted electrical elements created by electrical components—at high power. On the component level, metal-oxide- semiconductor field-effect transistors (MOSFETs)—one of the fundamental building blocks of analog electronics—are nonideal devices known to exhibit a variety of parasitics that result from the device structure. MOSFETs are prone to parasitic capacitances, such as gate-oxide capacitance, and O ne of the most important considerations in the design of high-power analog power electronics is the reliability of the system. To operate properly with minimal risk of failure regardless of environmental conditions, modes of operation, and device age, the product must be designed to ensure the highest reliability possible. However, this requirement poses a significant design challenge, as high power can often be at odds with high reliability in analog design. This conflicting relationship has become even more dramatic with the current industry trend of increasing power density. In this article, I'll be discussing several reasons why high power and high reliability can conflict and the ways that Apex Microtechnology approaches these issues to meet high-power demands in high-reliability applications. Eric Boere, Field Applications Engineer at Apex Microtechnology Achieving high reliability is always a challenge, but it becomes particularly difficult when dealing with high-power applications. HIGH POWER in HIGH - RELIABILITY DESIGNS