Supplier eBooks

Infineon - Enabling Compact, Efficient Designs with High Voltage CoolSiC™ Discretes

Issue link: https://resources.mouser.com/i/1537950

Contents of this Issue

Navigation

Page 3 of 21

Technology Overview and Evolution of the 1200 V CoolSiC™ Technology Chapter 1 Trench Design and Technology Foundation Central to Infineon's CoolSiC™ technology is its innovative trench design. This architecture solves a long-standing challenge for power semiconductor designers—balancing performance, robustness, and reliability. By maximizing efficiency while ensuring device longevity, the trench design sets CoolSiC™ apart in the silicon carbide industry. What makes this design notable is its gate oxide reliability. Infineon's CoolSiC™ trench design achieves gate oxide reliability, which directly improves performance in real-world applications. This means devices that not only perform better but also last longer under demanding conditions. 4 Enabling Compact, Efficient Designs with High Voltage CoolSiC™ Discretes

Articles in this issue

view archives of Supplier eBooks - Infineon - Enabling Compact, Efficient Designs with High Voltage CoolSiC™ Discretes